Receiver with Clock Recovery Circuit and Adaptive Sample and Equalizer Timing

ABSTRACT

A receiver is equipped with an adaptive phase-offset controller and associated timing-calibration circuitry that together shift the timing for a data sampler and a digital equalizer. The sample and equalizer timing is shifted to a position with less residual inter-symbol interference (ISI) energy relative to the current symbol. The shifted position may be calculated using a measure of signal quality, such as a receiver bit-error rate or a comparison of filter-tap values, to optimize the timing of data recovery.

FIELD

The subject matter disclosed herein relates generally to the field ofcommunications, and more particularly to high speed electronic signalingwithin and between integrated circuit devices.

BACKGROUND

Synchronous digital systems employ clock signals to coordinate thetransmission and receipt of data. For example, a transmitter mightsynchronize transmitted data to a clock signal and then convey thesynchronized data and clock signals to a receiver. The receiver mightthen recover the data using the clock signal. High-performance digitaltransmitters often communicate data unaccompanied by a clock signal withwhich to synchronize the receiver. Instead, the receiver phase-aligns alocally generated receive clock signal to the incoming data and uses thephase-adjusted “recovered” clock signal to sample the data. Receivecircuitry for sampling data using a recovered clock signal is commonlyreferred to as “clock and data recovery” (CDR) circuitry.

High-performance communication channels suffer from many effects thatdegrade signals. Primary among them is inter-symbol interference (ISI)from high frequency signal attenuation and reflections due to impedancediscontinuities. ISI becomes more pronounced at higher signaling rates,ultimately degrading signal quality such that distinctions betweenoriginally transmitted signal levels may be lost. Some receiverstherefore mitigate the effects of ISI using one or more equalizers, andthus increase the available signaling rate. Typical types of equalizersinclude linear equalizers, feed-forward equalizers (FFEs), anddecision-feedback equalizer (DFEs).

BRIEF DESCRIPTION OF THE DRAWINGS

The subject matter disclosed is illustrated by way of example, and notby way of limitation, in the figures of the accompanying drawings and inwhich like reference numerals refer to similar elements and in which:

FIG. 1 depicts a portion of an integrated circuit (IC) 100, including areceiver 105 and some core logic 110.

FIG. 2 is a waveform diagram 200 depicting a hypothetical series ofoverlapping single-bit responses for a series of symbols on node Vin ofFIG. 1.

FIG. 3 is a waveform diagram 300 depicting a second hypothetical seriesof overlapping single-bit responses for a series of symbols on node Vinof FIG. 1.

FIG. 4 is a waveform diagram 400 depicting hypothetical single-bitresponses for an equalized series of symbols on node Veq of FIG. 1.

FIG. 5 is a waveform diagram 500 depicting another hypothetical seriesof single-bit responses for an equalized series of symbols on node Veqof FIG. 1.

FIG. 6 is a flowchart 600 depicting a phase offset calibration methodthat can be applied to the embodiment of receiver 105 of FIG. 1.

FIG. 7 depicts a receiver 700 in accordance with another embodiment.

FIG. 8A details equalization control circuitry 740 and signal qualitymeasurement circuitry 750 in accordance with one embodiment.

FIG. 8B details an embodiment of a tap-value generator 826, that may beused as tap-value generator 825 of FIG. 8A and, that is capable ofgenerating a tap value using a sign-sign, least-mean-squared (LMS)algorithm.

FIGS. 8C through 8F are hypothetical waveform diagrams used inconnection with FIGS. 7 and 8A to illustrate the process of applyingappropriate receive coefficients RXα[2,1] to DFE 734 to correct for ISI.

FIG. 8G is a flowchart 857 outlining a process by which precursormeasurement block 810 of FIG. 8A may calculate precursor receive-channelcoefficient RXα[−1].

FIG. 9 is a flowchart 900 depicting a phase offset calibration methodthat can be applied to the embodiment of receiver 700 of FIG. 7.

FIG. 10 depicts a receiver 1000 in accordance with yet anotherembodiment.

FIG. 11 depicts equalization control circuitry 1050 and signal qualitymeasurement circuitry 1055 of FIG. 10 in accordance with one embodiment.

FIG. 12 depicts a receiver 1200 in accordance with another embodiment.

FIG. 13 depicts a receiver 1300 in accordance with another embodiment.

FIG. 14 depicts a receiver 1400 in accordance with another embodiment.

FIG. 15 depicts a receiver 1500 in accordance with another embodiment.

DETAILED DESCRIPTION

FIG. 1 depicts a portion of an integrated circuit (IC) 100, including areceiver 105 and some core logic 110. Receiver 105 recovers data andtiming information from a signal presented on a data input port Vin toproduce a series of sampled data Data for core logic 110. Receiver 105optimizes data and equalization timing for improved signal margins andreduced error rates. Core logic 110 could be any of a myriad of circuittypes or combinations of circuit types that communicate with componentswithin or external to IC 100 via receiver 105.

Receiver 105 includes a data sampler 115, a reference-data sampler 120,and a reference edge sampler 125. Clock recovery circuitry 130 recoversreference edge and data clock signals REClk and RDClk from sampledreference edges REdge from sampler 125 and reference data RData fromsampler 120. Reference edge clock signal REClk is timed to the averageedge (signal transition) timing of signal Vin, where average edge timingmay be defined as the average instant at which a signal transitioncrosses a predetermined threshold (e.g., a reference voltage). Referencedata clock RDClk is phase shifted with respect to edge clock REClk suchthat sampler 120 samples signal Vin at the midpoint between the averageedge timing of signal Vin. In a double-data-rate system, for example,data clock signal RDClk may be phase shifted ninety degrees with respectto clock signal REdge. This shift may be fixed or adjustable.

Receiver 105 includes an equalizer 134 coupled between the output andthe input of data sampler 115. Equalizer 134 amplifies signal Vin usinga range of amplification factors, with higher frequency componentstypically being treated to higher amplification factors. The resultingequalized signal Veq is conveyed to the input of data sampler 115. Thecommunication channel (not shown) to which receiver 105 is coupled willtypically exhibit a low pass filter effect, in which case equalizer 134may be used to compensate for attenuation of higher-frequency signalcomponents. In general, the goal of equalization is to reduce orminimize the effects of ISI, so equalization is typically accomplishedby adjusting one or more characteristics of a signal in a manner thatmitigates the effects of ISI.

Equalizer 134, a decision-feedback equalizer (DFE) in the depictedexample, includes a finite-impulse-response (FIR) filter 135 and asubtractor 137. FIR 135 multiplies each of M recently received samplesData by a respective one of M tap coefficients α1-αM. Each of theresulting products approximates the ISI at the current symbol timeattributable to the respective one of the M prior symbols, and theseproducts are summed to produce a feedback signal VDFE, which representsthe cumulative postcursor ISI at the current symbol. Subtractor 137subtracts signal VDFE from signal Vin before sampler 115 samples thecurrent symbol. Receiver 105 thereby adjusts signal Vin to eliminate orat least mitigate the effects of the postcursor ISI imposed on thecurrent symbol by the prior M symbols.

The optimum values of tap coefficients α1-αM vary between devices andsystems, and can change with, for example, temperature, supply voltage,and the signaling environment. Equalization control circuitry 140 istherefore provided to find and maintain appropriate tap coefficients.Some or all of control circuitry 140 can be instantiated separately oras part of the same integrated circuit as the samplers, equalizer, andclock recovery circuitry.

Clock recovery circuitry 130 locks reference data clock RDClk to aposition that is not affected by the timing of equalizer 134. Thisallows signal RDClk to maintain a fixed reference phase relative to theincoming signal Vin, even as the equalizer tap coefficients areadjusted. Because RData_(N) are sampled from the unequalized signal,these samples will sometimes contain erroneous data. These imperfectionscan be tolerated for clock recovery, as a small percentage of erroneousdata can be filtered by the clock recovery loop.

As discussed below, clock signal RDClk may not be the optimal phase atwhich to sample Data_(N) to obtain the lowest bit error rate whenaccurate interpretation of data symbols is more critical. Receiver 105is therefore equipped with an adaptive phase-offset controller 145 andsignal-quality measurement circuit 150 that together shift the timing ofdata sampler 115 and DFE 134 to a position that provides improved datarecovery (for example, to a position with less residual ISI energyrelative to the main cursor).

Signal-quality measurement circuit 150 derives a measure (SQ) of signalquality from some signal-quality criteria, such as the bit-error rate(BER) of receiver 105. Phase-offset controller 145 in turn employssignal SQ to adjust the phase of data clock DClk relative to referencedata clock RDClk and edge clock REdge for optimal data recovery. In thisexample, the phase offset Φ_(OS) for data clock DClk is measured withrespect to reference data clock RDClk. Some or all of controller 145 andmeasurement circuit 150 can be instantiated separately or as part of thesame integrated circuit as the samplers, equalizer, and clock recoverycircuitry.

FIG. 2 is a waveform diagram 200 depicting hypothetical overlappingsingle-bit responses for a series of symbols on node Vin of FIG. 1, andis used to illustrate the deleterious effects of ISI. The depicted clocksignals are for a double-data-rate (DDR) receiver in which the datasamples occur at both the rising and falling edges of the data clocksRDClk/DClk. The single-bit responses are voltage levels measured withrespect to a voltage reference Vr: each single-bit response isnormalized to an amplitude of one for ease of illustration, withpositive values representing a logic one and negative valuesrepresenting a logic zero. The x axis represents time, measured in “unitintervals” or “symbol times,” with time N representing the currentsample instant, or “cursor,” and symbol S_(N) the current symbol.

Each symbol is spread out over time. Energy that occurs in the past withrespect to the cursor is termed “precursor ISI,” whereas energy thatoccurs in the future is termed “postcursor ISI.” If the symbols aresufficiently wide, a considerable portion of the precursor andpostcursor ISI from adjacent symbols can interfere with theinterpretation of the current symbol. In the instant hypothetical, attime N:

-   -   1. the current symbol S_(N) has an amplitude of 1.0 volts, a        level that is representative of a logic one;    -   2. symbol S_(N−2) imparts postcursor ISI of about −0.5 volts;    -   3. symbol S_(N−1) imparts postcursor ISI of about −0.8 volts;    -   4. symbol S_(NA+1) imparts precursor ISI of about −0.6 volts;        and    -   5. symbol S_(N+2) imparts relatively little precursor ISI, and        may be ignored in this example; however, the contribution of        this and other pre- and post-tap symbols may be considerable.        The sum of the voltages attributable to symbol S_(N) and the ISI        of the four adjacent symbols at time N is therefore about        1.0−0.5−0.8−0.6=−0.9, a level that is representative of a logic        zero. Sampling the depicted bit pattern at time N without        correcting for ISI would therefore produce an error at time N.

Diagram 200 is simplified for ease of illustration. In practice, thewaveform produced by a series of transmitted symbols is a complexcombination of the symbols and their overlapping ISI. Because eachsymbol can affect one or more of its neighbors, the ISI energy imposedon a sampled symbol can vary considerably with the bit pattern. Considerthe example of waveform 300 of FIG. 3: the bit pattern expressed is thesame as in FIG. 2 except that symbol S_(N+1) is inverted to represent alogic one instead of a logic zero. As a result, the precursor ISI fromsymbol S_(N+1) is positive, and tends to cancel the negative ISI fromthe other symbols. The sum of the voltages attributable to symbol S_(N)and the four adjacent ISI components at time N in this example is about1.0+0.6−0.5−0.8=0.3, a level that is representative of a logic one.Sampling the depicted bit pattern at time N without correcting for ISIwould therefore produce a correct result in this example.

FIGS. 2 and 3 illustrate the important point that the impact of ISI isdata dependent. Returning to FIG. 1, clock recovery circuitry 130depends on samplers 120 and 125 for clock recovery, and samplers 120 and125 sample the incoming signal before DFE 134 has reduced the impact ofISI. Clock recovery circuitry 130 may therefore base timing adjustmentson erroneous data samples. Clock recovery circuitry 130 can accommodateerroneous data if the bit error rate is sufficiently low. One or both ofsamplers 120 and 125 may sample equalized signal Veq in otherembodiments.

FIG. 4 is a waveform diagram 400 depicting hypothetical single-bitresponses for an equalized series of symbols on node Veq of FIG. 1. Thebit pattern is the same as in FIG. 2, but the symbol shapes lack much oftheir postcursor ISI due to the operation of DFE 134 and subtractor 137.Phase offset Φ_(OS) is set to zero, so data clock DClk and referencedata clock RDClk are identical. At sample time N, the amplitude ofsymbol S_(N) is about 1.0 and the precursor ISI components associatedwith symbols S_(N+1) and S_(N+2) are about −0.6 and −0.05, respectively.The postcursor ISI associated with symbols S_(N−1) and S_(N−2) arefiltered out, however, so that the sum of the current symbol and the ISIat time N is just under 0.4 Volts. This positive voltage level would becorrectly interpreted as a logic one, showing that postcursor ISIremoval by DFE 134 and subtractor 137 has improved the operation of thereceiver.

FIG. 5 is a waveform diagram 500 depicting another hypothetical seriesof single-bit responses for an equalized series of symbols on node Veqof FIG. 1. The bit pattern is the same as in FIGS. 2 and 4, and thesymbol shapes again lack much of their postcursor ISI due to theoperation of DFE 134 and subtractor 137. In addition, phase offsetΦ_(OS) advances data clock DClk by almost half the unit interval withrespect to reference data clock RDClk. At sample time N, the amplitudeof symbol S_(N) is about 0.9, less than it was in FIG. 4 when the phaseoffset was set to zero; however, the nonzero phase offset Φ_(OS) movesboth the DFE timing and the cursor position such that the precursor ISIassociated with symbols S_(N+1) and S_(N+2) are considerably lower thanin the example of FIG. 4, about −0.3 and zero, respectively. The sum ofthe current symbol and the ISI of waveform 500 is about 0.6 Volts, a 50%increase over the example of FIG. 4. This positive voltage level wouldbe correctly interpreted as a logic one, and the greater magnitude ofthe positive voltage reflects a higher margin for error. Receiver 105can thus alter sample and DFE timing to increase voltage margin andconsequently improve noise tolerance and reduce bit error rates.

FIG. 6 is a flowchart 600 depicting a phase-offset calibration methodthat can be applied to the embodiment of receiver 105 of FIG. 1. Tobegin, phase offset controller 145 sets phase offset Φ_(OS) equal tozero, in which case clock signal DClk is phase aligned with clock signalRDClk (step 605). The DFE tap coefficients are allowed to settle tostable values at this phase offset. Signal-quality measurement circuit150 then conveys a first measure of signal quality SQ1 to controller 145via port SQ (step 610). The measure of signal quality, now stored incontroller 145, may be based upon such measures as, for example, thevoltage margin, timing margin, or the bit error rate of receiver 105.

Next, phase-offset controller 145 increments phase offset Φ_(OS) (step615), which advances the phase of clock signal DClk with respect tosignal RDClk. After allowing the DFE tap coefficients α1-αM to settle tostable values at the new phase offset, measurement circuit 150 conveys asecond measure of signal quality SQ2 to controller 145 via port SQ.Phase offset controller 145 then compares signal quality measures SQ1and SQ2 to determine whether the increased phase offset improved signalquality (decision 625). If so, then measure SQ1 is overwritten with thevalue of measure SQ2 (step 630) and the process returns to step 615. Ifnot, then the phase offset is decremented twice (steps 635 and 640), theDFE coefficients α1-αM are again allowed to settle to stable values, andsignal quality is measured once again to obtain a third measure ofsignal quality SQ3. Per decision 650, if this third measure is greaterthan the first, then measure SQ1 is set to the improved measure SQ3(step 655) and the process returns to step 640 to determine whetherfurther reductions in the phase offset yield further improvements insignal quality. If decision 650 does not indicate an improved measure ofsignal quality, then the phase offset is incremented (step 660) and themethod moves to step 665 to await a subsequent initiation of thephase-offset calibration process. The process of flowchart 600 thussettles upon a phase offset that provides maximal signal quality andthen may be repeated occasionally or periodically to accommodate signaldrift that might occur due to e.g. supply-voltage fluctuations andchanges in temperature and the noise environment.

FIG. 7 depicts a receiver 700 in accordance with another embodiment.Receiver 700 includes a data sampler 715, an error sampler 717, areference-data sampler 720, a reference edge sampler 725, and a DFE 734.DFE 734 in turn includes an FIR 735 and a subtractor 737. Clock recoverycircuitry 730 recovers reference edge and reference data clock signalsREClk and RDClk from sampled reference data RData_(N) and edgesREdge_(N). Reference data clock RDClk is phase shifted with respect toedge REClk such that sampler 720 samples signal Vin at the midpointbetween the sample instants of sampler 725. In a double-data-ratesystem, for example, clock signal RDClk may be phase shifted ninetydegrees with respect to clock signal REClk.

FIR 735 multiplies the two most recently received symbols from sampler715 by a respective one of tap coefficients RXα[1] and RXα[2]. Each ofthe resulting products represents the ISI contributed to the currentsymbol Data_(N) by the respective prior symbol, and the sum of theseproducts VDFE represents the cumulative ISI from those symbols.Subtractor 737 subtracts the combined ISI components VDFE from signalVin before sampler 715 samples the current data symbol Data_(N). Theoptimal values of tap coefficients RXα[1] and RXα[2] vary betweendevices and systems, and can change with temperature, supply voltage,and the noise environment. Adaptive equalization control circuitry 740is therefore provided to find and maintain appropriate tap coefficients.

Clock recovery circuitry 730 can lock reference data signal RDClk to aposition that suboptimally accounts for the ISI characteristics of inputsignal Vin, and that consequently results in erroneous samples. Theseimperfections can be tolerated for edge recovery, as a small amount oferroneous data can be filtered out by the clock recovery loop. Suchsuboptimal sample timing is more of an issue with data recovery,however, where accurate interpretation of data symbols is critical.Receiver 700 is therefore equipped with adaptive signal qualitymeasurement circuitry 750 and associated phase-adjustment circuitry 755that together shift the timing for data sampler 715 and DFE 734 to aposition with less residual ISI energy relative to the current symbolData_(N).

Signal quality measurement circuitry 750 derives a measure SQ of signalquality from some signal-quality criteria. In this example, the measureof signal quality is the difference between the average voltage levelfor the current symbol S_(N) and the average precursor ISI imposed bythe next symbol S_(N+1). These values are represented in FIG. 7 as tapvalues RXα[0] and RXα[−1], respectively, and are calculated byequalization control circuitry 740 in a manner detailed below. Insummary, signal quality measurement circuitry 750 subtracts the absolutevalue of tap value RXα[−1] from the absolute value of tap value RXα[0]to produce signal SQ. The difference thus calculated is a measure of themagnitude of precursor ISI relative to the current symbol, and isconsequently a measure of signal quality. A phase-offset controller 760employs signal SQ to optimize a phase-adjust signal ΦA to an adder 765,the output of which controls the phase of sample clock DClk via a phaseinterpolator 770. The phase relationship between data clock DClk and thereference clocks derived from samples produced by reference samplers 720and 725 is therefore optimized for recovery of data Data_(N).

Clock recovery circuitry 730 includes a bang-bang (Alexander) phasedetector 775, multipliers 777 and 779, digital accumulators 781 and 783,adders 785 and 786, an edge phase interpolator 790, a reference-dataphase interpolator 795. Phase detector 775 logically combines thecurrent reference data sample RData_(N), the prior reference data sampleRData_(N−1) (not shown), and the current reference edge sample REdge_(N)between the current and prior data samples to determine whether the edgebetween the current and prior data samples is early or late with respectto the reference clock edge. Alexander phase detectors are well known tothose of skill in the art, so a detailed discussion is omitted. Briefly,samples RData_(N) and RData_(N−1) are one bit period (one unit interval)apart and sample REdge_(N) is sampled at half the bit period betweensamples RData_(N) and RData_(N−1). If the current and prior samplesRData_(N) and RData_(N−1) are the same (e.g., both represent logic one),then no transition has occurred and there is no “edge” to detect. Inthat case, the outputs E and L of phase detector 135 are both zero. Ifthe current and prior samples RData_(N) and RData_(N−1) are different,however, then the edge sample REdge_(N) is compared with the current andprior samples RData_(N) and RData_(N−1): if sample REdge_(N) equalsprior sample RData_(N−1), then late signal L is asserted; and if sampleREdge_(N) equals current sample RData_(N), then the early signal E isasserted. In this disclosure, a “late” edge arrives late with respect tothe sampling clock, whereas an “early” edge arrives early with respectto the sampling clock.

Multiplier 779 multiplies the phase error signal E/L by a constant Kiand outputs the multiplied value to accumulator 781. Multiplier 777multiplies phase error signal E/L by a constant Kp and outputs themultiplied value to adder 785, which sums the outputs of multiplier 777and accumulator 781 and passes the result to phase accumulator 783.Phase accumulator 783 accumulates a phase control signal (DC that ispassed to interpolator 790 and adder 786. Phase interpolators 790 and795 derive edge and data clocks REClk and RDClk, respectively, bycombining selected ones of a plurality of differently phased clocksignals P1-P4 that a phase-locked loop PLL 797 derives from a localreference clock RefClk. Adder 786 can add a fixed or variable offset tophase control signal ΦC. In this DDR embodiment, adder 786 adds a fixed90-degree offset to phase control signal ΦDC (i.e., ΦC+90°). In thisway, clock recovery circuitry 730 maintains the sample timing ofreference data clock RDClk centered between edges of the incoming data.

The four differently phased clock signals P1-P4 from PLL 797 areconveyed to data phase interpolator 770 of phase adjustment circuitry755 along with the sum of phase-adjust signal ΦA and phase-controlsignal ΦC. Phase interpolator 770 combines selected ones of signalsP1-P4 such that clock signal DClk is phase shifted with respect to clocksignal RDClk by an amount determined by phase adjust signal ΦA, andthereby shifts data-sample and equalization timing to a position thatprovides improved signal quality.

FIG. 8A details equalization control circuitry 740 and signal qualitymeasurement circuitry 750 in accordance with one embodiment.Equalization control circuitry 740 includes a tap controller 800, a datafilter 805, a precursor measurement block 810, and a DAC 817. Tapcontroller 800 includes a number of synchronous storage elements 820 andtap-value generators 825 that together generate tap coefficientsRXα[2,1,0] from data and error samples Data_(N) and Err_(N). Tap valueRXα[0] is a digital measure of the average amplitude of the receiveddata symbols S_(N), which DAC 817 converts into voltage Dlev, thereference voltage for error sampler 717 of FIG. 7. Tap values RXα[2,1]are the receive coefficients for DFE 734, also of FIG. 7.

The error comparisons that produce error signals Err_(N) are based uponthe upper signal level defined by voltage Dlev. Tap controller 800 thusonly updates the tap values RXα[2,1,0] based upon Err_(N−1) measurementsthat take place when the data sample Data_(N−1) is a logic one. Datafilter 805 therefore prevents tap controller 800 from updating tapvalues RXα[2,1,0] when sample Data_(N−1) is a logic zero. Otherembodiments can include a second comparator/sampler pair to generateerror samples when Data_(N−1) is a logic zero, such as by comparing theincoming signal Veq with the lower data level −Dlev, or the referencevoltage to the error sampler can be varied over a number of values orranges of values to facilitate additional testing and error-correctionmethods. Receive coefficients RXα[2,1,0] are adjusted such that DFE 734effectively cancels postcursor ISI associated with the preceding twodata symbols in the manner discussed above in connection with FIGS. 1-4.

Returning to FIG. 8A, the value RXα[0] is a measure of the averageamplitude for symbols S_(N) and the value RXα[−1] is a measure of thefirst precursor ISI magnitude from symbols S_(N+1). The differencebetween the absolute values of these measures is thereforerepresentative of signal quality, and is used in the embodiment of FIG.7 to control the phase offset for clock signal DClk. Statedmathematically, SQ=|RXα[0]|-|RXα[−1]|. Signal quality measurementcircuitry 750 receives signals RXα[0] and RXα[−1] and performs theforegoing calculation to obtain measures of signal quality SQ for phaseoffset controller 760.

FIG. 8B details an embodiment of a tap-value generator 826 thatgenerates a tap value using a sign-sign, least-mean-squared (LMS)algorithm, and which may be used in place of tap-generator 825 of FIG.8A or 11. Other algorithms, such as linear- or gradient-descent LMS, canbe used in other embodiments. Generator 825 includes an XNOR gate 830, amultiplier 835 that multiplies the output of XNOR gate 830 by a constantμ, an adder 840, and a register 845. XNOR gate 830 compares thecorresponding data and error samples and presents its output tomultiplier 835. The output of XNOR gate 830 represents a logic one fortrue and a logic negative one for false. The data and error samplesrepresent the signs of the sampled values, so XNOR gate 830 has theeffect of multiplying the signs and presenting the resulting product tomultiplier 835. Multiplier 835 multiplies the product from XNOR gate 830by a selected step size μ, which may be tailored for the selected filtertap. Adder 840 adds the output from multiplier 835 to the currentcontents of register 845, which is then updated with the new count.Register 845 thus accumulates a count representative of the alpha valuefor the filter tap associated with data samples of a particular latency(e.g., data samples D_(N−2)).

FIGS. 8C through 8F are hypothetical waveform diagrams used inconnection with FIGS. 7 and 8A to illustrate the process of applyingappropriate receive coefficients RXα[2,1] to DFE 734 to correct for ISI.FIG. 8C depicts an idealized transmit pulse 850 for which the valueexpressing the current data sample D_(N) at node VIN is normalized to avalue of one (1.0) and the prior and subsequent data samples D_(N−1) andData_(NA) are each normalized to a value of zero (0.0). FIG. 8D depicts,as a pulse 852, a version of transmit pulse 850 filtered by the receivechannel and appearing at node VIN. As compared with pulse 850, pulse 852is attenuated to a maximum amplitude of about 0.5 for the current datasample D_(N), the corrupted version of which is labeled cD_(N). Thepulse is further corrupted by channel ISI, which leads to erroneouspositive signal amplitudes of approximately cD_(N+1)=0.12 andcD_(N+2)=0.02 at the two succeeding symbol times, and cD_(N−1)=0.05 atthe preceding symbol time. The objective of receive equalization is, inpart, to compensate for the ISI effects at the symbol times succeedingthe main symbol time.

FIG. 8E is a waveform diagram 854 in which a receive-coefficientwaveform 855 is shown with the shape of pulse 852 of FIG. 8D toillustrate how the receive coefficients are applied to compensate forISI imposed by the receiver channel. In the example, the channel imposedISI components cD_(N+1) and cD_(N+2) of respective amplitudes 0.12 and0.02 at the two symbol times succeeding reception of corrupted datasymbol cD_(N). DFE 734 therefore subtracts coefficient waveform 855 fromthe received pulse 852 to cancel the ISI: DFE 734 subtractsData_(N)*RXα[1] from the received signal one symbol time after cD_(N)and subtracts Data_(N)*RXα[2] from the received signal two symbol timesafter cD_(N). In this example, RXα[0] is about 0.50, RXα[1] about 0.12,and RXα[2] about 0.02.

FIG. 8F depicts an equalized waveform 856 that is the sum of waveforms852 and 855 of FIG. 8E. Ideally, the compensation provided by DFE 734exactly counteracts the ISI associated with the prior data symbolswithout adversely impacting the current symbol. In practice, however,the application of receive coefficients may impact the current symboleD_(N). Furthermore, ISI associated with the first precursor tap is notcancelled in this example, and therefore leaves a noise artifactcD_(N−1) in waveform 856 one symbol time prior to receipt of the currentsymbol. The two post-tap artifacts are cancelled in this example,however, leaving equalized signal values eD_(N+1) and eD_(N+2) ofamplitude zero.

Returning to FIG. 8A, signal quality measurement circuitry 750 employsreceive coefficients RXα[0,−1] to calculate signal quality measure SQ.Receive coefficient RXα[−1] is calculated as discussed above inconnection with FIG. 8B, and precursor measurement block 810 and datafilter 805 together use coefficient RXα[0] to calculate RXα[−1]. Thefollowing discussion shows how equalization controller 740 of FIGS. 7and 8A can calculate a precursor receive-channel coefficient RXα[−1] inaccordance with one embodiment.

FIG. 8G is a flowchart 857 outlining a process by which precursormeasurement block 810 of FIG. 8A may calculate precursor receive-channelcoefficient RXα[−1]. First, in step 858, the receive coefficientsRXα[2,1,0] are calculated in the manner detailed above. In someembodiments, step 858 is accomplished by first holding values RXα[2,1]constant until value RXα[0] reaches equilibrium, at which time voltageDlev represents a measure of the average symbol amplitude for signalVeq. With reference to FIG. 7, voltage Dlev is considered to representthe amplitude of signal Veq when error signal Err_(N−1) is equallylikely to express a logic one or a logic zero when the correspondingsampled data symbol Data_(N−1) represents a logic one. Once voltage Dlevis established, the other two tap-value generators are enabled to findthe remaining receive coefficients RXα[2,1]. Once calibrated, the valuesof receive coefficients RXα[2,1] are held constant (step 860).

Next, in step 862, data filter 805 is set to enable Dlev adjustment whenincoming data expresses the pattern “10” (i.e., symbol Data_(N−1)=1 andsucceeding symbol Data_(N)=0). Per decision 864 and step 866, errorsamples Err_(N−1) are collected and coefficient RXα[0] adjusted untilErr_(N−1) is again 50% 1's and 50% 0's when this pattern is detected.Using the circuitry of FIG. 8A, these adjustments occur automatically ascontroller 740 finds the coefficient RXα[0], and consequently the levelDlev, specific to “10” data patterns. In step 868, measurement block 810stores the value of coefficient RXα[0] as RXα10. The process of steps862 through 868 is repeated for data pattern “11”. That is, in step 870data filter 805 is set to enable Dlev adjustment when incoming dataexpresses the pattern “11” (i.e., symbol Data_(N−)=1 and succeedingsymbol Data_(N)=1). Per decision 872 and step 874, error samplesErr_(N−1) are collected and coefficient RXα[0], and consequently levelDlev, is adjusted until Err_(N−1) is again 50% 1's and 50% 0's.Measurement block 810 then, in step 876, stores the new value of RXα[0]as RXα11.

With coefficients RXα[2,1] calibrated, the difference between valuesRXα11 and RXα10 is approximately twice the ISI associated with the firstprecursor filter position. Filter coefficient RXα[−1] can therefore becalculated using this difference (step 878). In some embodiments thedifference may be scaled, as by multiplying the difference by a constantC, or may be otherwise adjusted, for example, to compensate fordifferent transmit characteristics between the transmitting device andthe receiver. Other embodiments employ similar techniques to calculateadditional pre- or post-cursor transmit or receiver filter coefficients.Returning to the hypothetical example of FIGS. 8C through 8F, it may beseen that corrupted data sample cD_(N−1) has a value of about 0.05, socoefficient RXα[−1] is set to 0.05.

FIG. 9 is a flowchart 900 depicting a phase offset calibration methodthat can be applied to the embodiment of receiver 700 of FIG. 7. Tobegin, phase offset controller 760 sets an eight-bit phase adjustmentsignal ΦA to e.g. zero, in which case clock signal DClk is phase alignedwith clock signal RDClk (step 905). The DFE tap coefficients are allowedto settle to stable values at this phase. Signal quality measurementcircuit 750 then conveys a first measure of signal quality SQ tocontroller 760 via port SQ (step 910). The measure of signal quality,now stored in controller 760, is derived from tap values RXα[0,−1] asnoted above, but other factors may be considered instead of or inaddition to these values. For example, other embodiments might deriveadditional tap values for consideration. In the present example, phaseoffset controller 760 can set phase adjustment signal ΦA to any of 256values to stepwise advance the phase of clock signal DClk from zero toone unit interval ahead of reference data clock signal RDClk. Otherembodiments can offer more or fewer gradations and longer or shorterranges of phase offsets.

Next, phase offset controller 760 increments phase adjustment signal ΦA(step 915), which advances the phase of clock signal DClk with respectto signal RDClk. The DFE tap coefficients are allowed to settle tostable values at this phase. Phase offset controller 760 then captures asecond measure of signal quality SQ2 via port SQ and compares signalquality measures SQ1 and SQ2 to determine whether the increased phaseoffset improved signal quality (decision 925). If so, then measure SQ1is overwritten with the value of measure SQ2 (step 930) and the processreturns to step 915. If not, then the phase adjustment is decrementedtwice (steps 935 and 940), the DFE tap coefficients are allowed tosettle, and signal quality is measured once again to obtain a thirdmeasure of signal quality SQ3. Per decision 950, if this third measureis greater than the first, then measure SQ1 is set to the improvedmeasure SQ3 (step 955) and the process returns to step 940 to determinewhether further reductions in the phase offset yield furtherimprovements in signal quality. If decision 950 does not indicate animproved measure of signal quality, then the phase adjustment isincremented (step 960) and the method moves to step 965 to await asubsequent initiation of the phase-offset calibration process. In otherembodiments signal quality is measured across the range of phase offsetsettings in search of a maximum. The phase offset associated with themaximum may then be used as the starting point for step 905.

FIG. 10 depicts a receiver 1000 in accordance with yet anotherembodiment. Receiver 1000 is in many ways like receiver 700 of FIG. 7,with like-numbered elements being the same or similar. Receiver 1000omits a reference data sampler and associated phase interpolator infavor of a delay element 1005 controlled by phase adjustment signal ΦA.Delay element 1005 produces reference data signal RData_(N) by delayingdata signal Data_(N) by the same amount clock signal DClk is advanced.Reference data signal RData_(N) therefore remains centered betweenaverage symbol edges as data clock DClk is phase shifted to a preferredsample instant. Receiver 1000 may also include a separate phaseinterpolator 1010 for DFE 734. Phase offset controller 706 is modifiedto produce a separate phase-adjustment signal DFEΦA to allow clockssignals DClk and DFEClk to be adjusted independently. This circuitry maybe included to facilitate test procedures, accommodate disparate delaysbetween DFE 734 and data sampler 715, etc. Delay element 1005 may bereplaced with a re-timer to transfer incoming data Data_(N) from theDClk domain to the REClk domain. Such an embodiment would facilitateboth advancing and retarding equalization timing relative to the averageedge timing of signal Vin.

Receiver 1000 differs from receiver 700 in another important respect.Equalization control circuitry 740 and signal quality measurementcircuitry 750 of FIG. 700 measure signal quality as a function ofprecursor ISI. Equalization control circuitry 1050 of receiver 1000additionally measures a postcursor ISI component RXα[U], which signalquality measurement circuitry 1055 employs with components RXα[0,−1] todevelop a measure of signal quality SQ. The postcursor ISI componentRXα[U] is not fed to DFE 734 in this example, and thus corresponds to anunequalized postcursor signal component.

FIG. 11 depicts equalization control circuitry 1050 and signal qualitymeasurement circuitry 1055 of FIG. 10 in accordance with one embodiment.Equalization control circuitry 1050 is similar to equalization controlcircuitry 740 of FIGS. 7, 8A, and 8B, like-labeled elements being thesame or similar. Equalization control circuitry 1050 includes tapcontroller 800. Tap controller 800 includes one or more additionalstorage elements 820 to provide data filter 805 with values ofpreviously received data. Uncorrected postcursor ISI component RXα[U]may be measured in a manner similar to the way in which RXα[−1] wasmeasured according to the method described in FIG. 8G. When measuringRXα[U], uncorrected ISI measurement circuit 1010 uses data patternsselected by data filter 805. For example, data filter 805 may enableDlev adjustment when the incoming data pattern is such that Data_(N−1)=1and Data_(N−Y)=0 in a step corresponding to 802 in FIG. 8G. Theresulting value of RXα[0] stored as RXα0U1 in the step corresponding to868. Value RXα0Y1 is representative of the average signal level whenData_(N−1) is a logical 1 and Data_(N−Y) is a logical 0. Similarly, thedata filter may search for occurrences where Data_(N−1)=1 andData_(N−Y)=1 in the step corresponding to 876 in FIG. 8G, and theresulting value of RXα[0] stored as RXα1U1 in the step corresponding to876. Value RXα1Y1 is representative of the average signal level whenData_(N−1) is a logical 1 and Data_(N−Y) is a logical 1. In a stepcorresponding to 878 in FIG. 8G, RXα[U] is calculated from RXα1U1 andRXα0U1. In some embodiments of FIG. 11 U=Y−1. The absolute values ofRXα[−1] and RXα[U] are both subtracted from the absolute values ofRXα[0] to obtain a measure of signal quality SQ. Stated mathematically,SQ=|RXαa[0]|−|RXα[−1]|−|RXα[U]|. Signal quality measurement circuitry1055 thus provides measures of signal quality based in part onpostcursor ISI to phase offset controller 760.

FIG. 12 depicts a receiver 1200 in accordance with another embodiment.Receiver 1200 is similar to receiver 105 of FIG. 1 but is provided withan external reference clock and thus omits clock recovery circuitry andrelated samplers. Receiver 1200 is equipped with equalization controlcircuitry 1050 and signal quality measurement circuitry 1055 of FIG. 10,which together allow receiver 1200 to adapt the timing of sampler 115and DFE 134 relative to clock signal ExtClk based upon a measure ofsignal quality that takes into account a measure of postcursor ISI.Input signal Vin is timed to clock signal ExtClk, so signal ExtClk is anaccurate measure of the average edge timing of signal Vin. Shifting thephase of clock signal DClk relative to external clock signal ExtClktherefore moves the data sample timing relative to the averagetransition time for signal Vin. In other embodiments ExtClk has a fixedphase offset from the average edge timing of signal Vin.

FIG. 13 depicts a receiver 1300 in accordance with another embodiment.Receiver 1300 is similar to receiver 105 of FIG. 1, but is equipped withequalization control circuitry 1050 and signal quality measurementcircuitry 1055 of FIG. 10, which together allow receiver 1300 to adaptthe timing of sampler 115 and DFE 134 relative to the average edgetiming of signal Vin based upon a measure of signal quality that takesinto account a measure of postcursor ISI. Edge sampler 125 detectssignal transitions (edges) with respect to an edge reference level Ver.Signal transitions to not happen instantaneously, so edge timing can besensed early or late by varying reference level Ver. In this exampleclock recovery circuitry 1305 is adapted to vary reference level Verbased upon the value of phase adjust signal ΦA. An optional delayelement 1310, or a re-timer, employs phase adjust signal ΦA to maintainreference data clock RDClk centered between the average edge instants ofsignal Vin. For high-to-low transitions, increasing reference voltageVer causes REClk to move to an earlier phase, but for low-to-hightransitions increasing reference voltage Ver causes REClk to move to alater phase. Clock recovery circuitry 1305 may therefore employ a datafilter (not shown) to facilitate pattern-specific adjustments toreference level Ver. In other embodiments delay element 1310 is omitted,or the functionality provided thereby is accomplished inside clockrecovery circuitry 1305. With reference to FIG. 7, for example,reference clock RDClk can be phase offset with respect to edge clockREClk by adjusting the signal to adder 786 to some value other than 90°.

FIG. 14 depicts a receiver 1400 in accordance with yet anotherembodiment. Receiver 1400 is similar to receiver 1300 of FIG. 13,like-identified elements being the same or similar. Edge sampler 125detects signal transitions (edges) with respect to a fixed edgereference level Ver in this embodiment. The timing of edge crossingsvaries with the pattern of the incoming data. For example, a signaltransition to a logic-one data level following a stream of logic-zerosymbols typically takes longer to cross a given threshold than a signaltransition to a logic one following a stream of alternating symbols. Thetiming of the edge clock signal REClk can therefore be varied relativeto the average edge timing of signal Vin by basing the edge sampling ona selected data pattern or patterns. Clock recovery circuitry 1405 ofreceiver 1400 therefore includes pattern matching logic 1410 thatselects one or more desired patterns based upon the value of phaseadjust signal ΦA. Other embodiments combine pattern matching withreference-voltage offsetting like that of FIG. 13 to provide additionalflexibility.

FIG. 15 depicts a receiver 1500 in accordance with yet anotherembodiment. Receiver 1500 is similar to receiver 1300 of FIG. 13, butomits the reference data sampler. Instead, clock recovery circuitry 1505extracts a reference edge clock REClk and a data clock DClk common tosampler 115 and DFE 134 using sampled edges REdge and data Data. REClkand DClk may have a fixed phase relationship, such as a constant 90degree phase offset. Receiver 1500 is equipped with equalization controlcircuitry 1050 and signal quality measurement circuitry 1055 of FIG. 10,which together allow receiver 1500 to adapt the timing of sampler 115and DFE 134 relative to the average edge timing of signal Vin based upona measure of signal quality that takes into account a measure ofpostcursor ISI. As in the embodiment of FIG. 13, clock recoverycircuitry 1505 is adapted to vary reference level Ver based upon thevalue of phase adjust signal ΦA. Clock recovery circuitry 1305 mayemploy a data filter (not shown) to facilitate pattern-specificadjustments to reference level Ver for reasons discussed above inconnection with FIG. 13.

In the foregoing description and in the accompanying drawings, specificterminology and drawing symbols are set forth to provide a thoroughunderstanding of the present invention. In some instances, theterminology and symbols may imply specific details that are not requiredto practice the invention. For example, the interconnection betweencircuit elements or circuit blocks may be shown or described asmulti-conductor or single conductor signal lines. Each of themulti-conductor signal lines may alternatively be single-conductorsignal lines, and each of the single-conductor signal lines mayalternatively be multi-conductor signal lines. Signals and signalingpaths shown or described as being single-ended may also be differential,and vice-versa. Similarly, signals described or depicted as havingactive-high or active-low logic levels may have opposite logic levels inalternative embodiments.

An output of a process for designing an integrated circuit, or a portionof an integrated circuit, comprising one or more of the circuitsdescribed herein may be a computer-readable medium such as, for example,a magnetic tape or an optical or magnetic disk. The computer-readablemedium may be encoded with data structures or other informationdescribing circuitry that may be physically instantiated as anintegrated circuit or portion of an integrated circuit. Although variousformats may be used for such encoding, these data structures arecommonly written in Caltech Intermediate Format (CIF), Calma GDS IIStream Format (GDSII), or Electronic Design Interchange Format (EDIF).Those of skill in the art of integrated circuit design can develop suchdata structures from schematic diagrams of the type detailed above andthe corresponding descriptions and encode the data structures oncomputer readable medium. Those of skill in the art of integratedcircuit fabrication can use such encoded data to fabricate integratedcircuits comprising one or more of the circuits described herein.

While the present invention has been described in connection withspecific embodiments, variations of these embodiments will be obvious tothose of ordinary skill in the art. For example, receivers in accordancewith other embodiments may include other equalizers instead of or inaddition to a DFE, including for example a partial-response DFE, and maybe adapted for use with multi-pulse-amplitude-modulated (multi-PAM)signals. Moreover, some components are shown directly connected to oneanother while others are shown connected via intermediate components. Ineach instance the method of interconnection, or “coupling,” establishessome desired electrical communication between two or more circuit nodes,or terminals. Such coupling may often be accomplished using a number ofcircuit configurations, as will be understood by those of skill in theart. Therefore, the spirit and scope of the appended claims should notbe limited to the foregoing description. Only those claims specificallyreciting “means for” or “step for” should be construed in the mannerrequired under the sixth paragraph of 35 U.S.C. §112.

1. (canceled)
 2. A receiver comprising: a data input port; an edgesampler coupled to the data input port; clock recovery circuitry havinga clock-recovery input port, coupled to the data input port via the edgesampler, and a clock-recovery output port; a data sampler having adata-sampler input terminal, coupled to the data input port, and adata-sampler output terminal; an equalizer coupled to the data-samplerinput terminal, the equalizer having an equalizer clock terminal; and anadaptive phase-offset controller coupled between the clock-recoveryoutput port of the clock recovery circuitry and the equalizer clockterminal, the phase-offset controller having a phase-offset controlport.
 3. The receiver of claim 2, wherein the data input port is toreceive a signal comprised of a series of data symbols and the datasampler is to sample the data symbols to produce a series of sampleddata, the receiver further comprising a signal quality measurementcircuit, coupled to the phase-offset control port, to derive a qualitymeasure for the sampled data.
 4. The receiver of claim 3, furthercomprising equalization control circuitry coupled to the signal qualitymeasurement circuit.
 5. The receiver of claim 2, further comprising asecond data sampler coupled between the data input port and the clockrecovery circuitry.
 6. The receiver of claim 5, wherein the edge samplerreceives an edge clock signal having an edge-clock phase, the seconddata sampler receives a reference-data clock signal having areference-data phase, and the phase-offset controller issues anequalizer clock signal having an equalizer clock phase.
 7. The receiverof claim 6, wherein the phase-offset controller varies the equalizerclock phase with respect to at least one of the edge-clock phase and thereference-data phase.
 8. The receiver of claim 2, wherein the datasampler includes a data-clock terminal coupled to the equalizer clockterminal.
 9. The receiver of claim 2, wherein the data input port is toreceive a signal comprised of a series of data symbols and the datasampler is to sample the data symbols to produce a series of sampleddata, the receiver further comprising a signal quality measurementcircuit, coupled to the phase-offset control port, to derive a qualitymeasure for the sampled data, and wherein the quality measure includes ameasure of intersymbol interference (ISI).
 10. The receiver of claim 9,wherein the equalizer does not equalize based on the measure of ISI. 11.A method comprising: receiving an analog input signal expressing aseries of data symbols; sampling edges of the series of data symbols torecover an edge timing reference signal from the series of data symbols;deriving a second timing reference signal from the edge timing referencesignal; applying an equalization signal timed to the second timingreference signal to equalize the input signal; measuring signal qualityof the input signal; and phase adjusting the second timing referencesignal relative to the edge timing reference signal based on the qualityof the input signal.
 12. The method of claim 11, wherein measuring thesignal quality of the input signal comprises considering a bit-errorrate of the series of data symbols.
 13. The method of claim 11, whereinmeasuring the signal quality of the input signal comprises measuringprecursor intersymbol interference (ISI) for the data symbols.
 14. Themethod of claim 11, wherein measuring the signal quality of the inputsignal comprises measuring intersymbol interference (ISI) for the datasymbols.
 15. The method of claim 14, wherein the ISI is unequalized ISI.16. An integrated circuit comprising: a data sampler having adata-sampler input port, to receive an input signal, the data sampler tosample the input signal and provide a series of sampled data symbols ona data sampler output port; a decision feedback equalizer (DFE) coupledbetween the data-sampler input port and the data sampler output port,the decision feedback equalizer including an equalizer control port andan equalizer clock port; an edge sampler to derive edge samples from theinput signal; clock recovery circuitry to recover an edge clock from theedge samples; and an adaptive phase offset control circuit to provide aDFE clock to the equalizer clock port, wherein the adaptive phase offsetcircuit varies the phase of the DFE clock relative to the edge clockbased on a measure of signal quality for the input signal.
 17. Theintegrated circuit of claim 16, further comprising timing calibrationcircuitry to provide the measure of signal quality to the phase offsetcontrol circuit.
 18. The integrated circuit of claim 16, furthercomprising a second data sampler to sample the input signal and toprovide the resulting second series of data symbols to the clockrecovery circuitry.
 19. The integrated circuit of claim 16, furthercomprising equalizer control circuitry coupled to the equalizer controlport.
 20. The integrated circuit of claim 19, wherein the equalizercontrol circuitry provides the measure of signal quality.
 21. Theintegrated circuit of claim 16, wherein the measure of signal quality isbased upon a measure of intersymbol interference.